发明名称 APPARATUS FOR DETECTING ANGLE OF INCLINATION
摘要 PURPOSE:To easily detect the angle of inclination by dispensing with the movement of parts of the positional alignment thereof with a specific position, by counting the lengths of the same length image patterns in the binarized image of rectangular parts and the scanning lines thereof. CONSTITUTION:The image patterns W1, W2, W3...Wn contained at every scanning lines n1, n2, n3...nx by an image pick-up apparatus 10 are binarized by a binarization circuit 11 and counted by a counter to calculate the respective length thereof. The calculated image pattern lengths are successively compared to each other at every scanning lines by a same length image pattern detection part 12. The area S of a rectangular shape is calculated according to a formula A=a.b. The area S' calculated by detecting the same length scanning lines of rectangular parts is calculated from the product of the count value of the same length image pattern detection part 12 and the value calculated by adding 1 to the scanning line count value to obtain calculation formulae S'/S=bsintheta/a and theta=sin<-1>(S'/a<2>). From these calculation formulae, the angle of inclination of the rectangular shape is calculated by an operation part 14.
申请公布号 JPS61219807(A) 申请公布日期 1986.09.30
申请号 JP19850062419 申请日期 1985.03.27
申请人 NEC CORP 发明人 HAYASHIDA KIYOTOMI
分类号 G01B11/26;(IPC1-7):G01B11/26 主分类号 G01B11/26
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