发明名称 SEMICONDUCTOR PACKAGE
摘要 PURPOSE:To prevent a decrease in reliability due to solder flow by providing a solder flow preventive wall for preventing the flow in the case of placing a semiconductor chip on a die pad area from flowing out to a wire bonding area. CONSTITUTION:A board 1, a metallized layer 2 formed on the board 1 and having a die pad area 15 and a wire bonding area 16, and a solder flow preventive wall 7 formed between the areas 15 and 16 on the layer 2 and preventing solder flow in the case of placing a semiconductor chip 9 on the area 15 from flowing out to a wire bonding area are provided. Accordingly, the wall 7 formed on the layer 2 prevents the flow from flowing out to the area 16 at the time of placing the chip on the area 15. Thus, a decrease in reliability due to the flow can be prevented.
申请公布号 JPH03248541(A) 申请公布日期 1991.11.06
申请号 JP19900044424 申请日期 1990.02.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 OGATA TOSHIICHI
分类号 H01L21/52;H01L21/60;H01L23/057;H01L23/498 主分类号 H01L21/52
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