发明名称 Electric circuit evaluation method
摘要 The electric circuit evaluation method according to the present invention comprises: a step for finding a malfunction power frequency property, in which the magnitude of a critical noise signal at which a designated electric circuit causes a malfunction is represented by the power injected into the designated electric circuit; and a step for finding a malfunction current frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a current (I_LSI) flowing to a predetermined portion of the designated electric circuit, and a malfunction voltage frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a voltage (V_LSI) occurring between predetermined points of the designated electric circuit, both of which properties found from the malfunction power frequency property.
申请公布号 US9400300(B2) 申请公布日期 2016.07.26
申请号 US201414296554 申请日期 2014.06.05
申请人 ROHM CO., LTD. 发明人 Hiraga Noriaki
分类号 G01R31/02;G01R23/02;G01R31/00;G01R19/00;G01R31/28 主分类号 G01R31/02
代理机构 Cantor Colburn LLP 代理人 Cantor Colburn LLP
主权项 1. An electric circuit evaluation method comprising the following steps: a step for finding a malfunction power frequency property, in which the magnitude of a critical noise signal at which a designated electric circuit causes a malfunction is represented by the power injected into the designated electric circuit; and a step for finding a malfunction current frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a current flowing to a predetermined portion of the designated electric circuit, and a malfunction voltage frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a voltage occurring between predetermined points of the designated electric circuit, both of which properties being found from the malfunction power frequency property.
地址 Kyoto JP