发明名称 Etch stop layer using polymers for integrated circuits
摘要 An etch stop layer (22) for permitting distinguishing between two similar layers (20, 24), such as two oxide layers, during etching is provided. The etch stop layer comprises a silicon-oxyhalide polymer, preferably a silicon-oxyfluoride polymer. Use of the polymer as an etch stop layer permits closer placement of metal conductor surfaces (12, 12') and contacts (14').
申请公布号 US5395796(A) 申请公布日期 1995.03.07
申请号 US19930002573 申请日期 1993.01.11
申请人 ADVANCED MICRO DEVICES, INC. 发明人 HASKELL, JACOB D.;GUPTA, SUBHASH
分类号 H01L21/3105;H01L21/311;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/3105
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