发明名称 MICROSCOPE WITH SCANNING TYPE PROBE
摘要 PROBLEM TO BE SOLVED: To prevent the distorsion of an image to avoid a measurement error, and hold Z-directional high rigidity without extending a scanner by calculating and correcting the circular displacement in vertical direction by the circular scanning of a piezoelectric scanner. SOLUTION: A Z-directional circular displacement arithmetic part 10 determines the Z-directional circular displacement errorΔh by use of the sensor output and the displacement detected values from X, Y displacement sensors. Sensors for detecting the Z-directional displacement are provided in three positions of the center and X, Y directions of a cylindrical piezoelectric scanner within the X, Y planes of the scanner, and the correction quantity is determined on the basis of their detected displacements and the X, Y-directional displacements, and a compensating quantity is added to the applied voltage from a Z-directional servo control system to correct the Z-displacement circular error. The Z-directional applied voltage to the piezoelectric scanner is regulated and controlled by the Z-servo control system, whereby the Z- directional measurement error is corrected. Since the Z-directional displacement error by the circular displacement of the scanner 6 is calculated, converted into a corrected voltage, and applied to an electrode 7 to perform a feedback control, the Z-directional circular displacement error can be removed.
申请公布号 JPH1090283(A) 申请公布日期 1998.04.10
申请号 JP19960239354 申请日期 1996.09.10
申请人 OLYMPUS OPTICAL CO LTD 发明人 WARABE TAKESHI
分类号 G01B7/34;G01B21/30;G01N37/00;G01Q10/04;G01Q10/06;G01Q30/06;G01Q60/24;G01Q90/00;(IPC1-7):G01N37/00 主分类号 G01B7/34
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