| 摘要 |
PROBLEM TO BE SOLVED: To reduce the testing period to prevent generation of a momentary heavy current and deterioration of a semiconductor element by sequentially enabling continuously all word lines and then latching such condition when the burn-in test is completed. SOLUTION: A row address multiplexer 12 selects an external or internal address ACL or HX to output an address AX and a row address predecoder 13 inputs such output to output a decider output BAX. A latch type decoder 14 decodes again the output BAX and latches a plurality of addresses with an input of FLAG from a burn-in flag (FLAG) generating section 17 to output CAX. A word line(WL) driver 15 sequentially enables continuously the word lines WL0 to WLn in unit of two lines with an output CAX and maintains such condition until the burn-in test is completed. Thereby, the testing period can be reduced and generation of momentary heavy current and characteristic deterioration of semiconductor element can also be prevented. |
