发明名称 SAMPLE-AND-HOLD CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a sample-and-hold circuit in which miniaturization of constitution can be achieved. SOLUTION: This circuit is constituted, so that in a first sampling period, analog data of a high-level side potential is inputted via a FET 7, which is the only P-channel, and is sampled, in a second sampling period, analog data of a low level side potential is inputted though a FET 8 which is the only N-channel, and is sampled.
申请公布号 JP2002015591(A) 申请公布日期 2002.01.18
申请号 JP20000191271 申请日期 2000.06.26
申请人 TOSHIBA CORP 发明人 HARUKI SATOSHI
分类号 G02F1/133;G09G3/20;G09G3/36;G11C27/02;(IPC1-7):G11C27/02 主分类号 G02F1/133
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