发明名称 |
Simplified optical proximity correction based on 1-dimension versus 2-dimension pattern shape classification |
摘要 |
A system that facilitates optical proximity correction comprises a layout that is desirably transferred to a silicon wafer, and an optical proximity correction component that alters the layout based at least in part upon a distinction between one-dimensional patterns and two-dimensional patterns within the layout. The system can comprise a block generator that replaces two-dimensional patterns within the layout with blocks. A model-based optical proximity correction component thereafter performs model-based optical proximity correction upon one-dimensional patterns within the layout.
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申请公布号 |
US7263683(B1) |
申请公布日期 |
2007.08.28 |
申请号 |
US20040935334 |
申请日期 |
2004.09.07 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
CAPODIECI LUIGI |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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