| 摘要 |
The invention relates to a schematic presentation of a flowchart of a method (200) for leakage-current-compensated resistance measurement. The method comprises a step (205) in which a first voltage of the first voltage source is applied to the first connection of the resistor and a step (210) in which a second voltage of the second voltage source, which differs from the first voltage, is applied to the second connection of the resistor. Thereafter, in step (215), a first current flow between the first voltage source and the first connection of the resistor is measured. In a step (220), after the measurement of the first current flow (45), the second voltage source (15) is set in such a way that the second voltage (35') has a voltage value that differs from the previous voltage value. Then, in step (225), a second current flow between the first voltage source and the first connection of the resistor is measured. In step (230), on the basis of the two measurements, the resistance value of the resistor is calculated on the basis of a first current flow compensated by means of the second current flow. |
