SEMICONDUCTOR TENSOMETERING SCANNER WITH TEMPERATURE COMPENSATION,申请号CS19840007818-传众专利搜索

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发明名称	SEMICONDUCTOR TENSOMETERING SCANNER WITH TEMPERATURE COMPENSATION
摘要
申请公布号	CS240298(B1)	申请公布日期	1986.02.13
申请号	CS19840007818	申请日期	1984.10.15
申请人	VANEK,FRANTISEK,CS;POSPISIL,KAREL,CS	发明人	VANEK,FRANTISEK,CS;POSPISIL,KAREL,CS
分类号	G01K7/20;(IPC1-7):G01K7/20	主分类号	G01K7/20
代理机构		代理人
主权项
地址

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