发明名称 Method of manufacturing shallow junction field effect transistor
摘要 Shallow junctions n- and p-channel field effect transistors are formed with a single ion implant into a conformal tungsten silicide layer. Although phosphorous and boron are implanted into the same silicide regions, the phosphorous prevents the boron from outdiffusing.
申请公布号 US5395787(A) 申请公布日期 1995.03.07
申请号 US19930160701 申请日期 1993.12.01
申请人 AT&T CORP. 发明人 LEE, KUO-HUA;LIU, CHUN-TING;LIU, RUICHEN
分类号 H01L29/78;H01L21/265;H01L21/8238;H01L27/092;(IPC1-7):H01L21/265 主分类号 H01L29/78
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