TESTING CARRIER FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE,申请号KR19950005363-传众专利搜索

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发明名称	TESTING CARRIER FOR SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要
申请公布号	KR0165154(B1)	申请公布日期	1999.02.01
申请号	KR19950005363	申请日期	1995.03.15
申请人	FUJITSU LIMITED	发明人	SIKEYUKKI, MARUYAMA
分类号	H01L21/66;G01R1/04;G01R31/28;(IPC1-7):G01R31/26	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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