发明名称 HALFTONE PHASE SHIFT MASK BLANK AND HALFTONE PHASE SHIFT MASK
摘要 PROBLEM TO BE SOLVED: To provide a halftone phase shift mask blank and a halftone phase shift mask which does not cause changes in the optical consts. such as transmirsirity, refractive index and extinction coefft. even through processes of heat treatment and treatment with specified chemicals. SOLUTION: A translucent film 12 comprising zirconium or a zirconium compd. with controlled refractive index, extinction coefft. and film thickness is formed on a transparent substrate of quartz glass by sputtering a zirconium or zirconium silicide target in an atmosphere of nitrogen, oxygen, halogen gas or the like. Then the film is heat treated in air or oxidative atmosphere at >=200 deg.C to form an oxide film 13 on the translucent film 12 to produce a halftone phase shift mask blank 10. Then the halftone phase shift mask blank 10 is patterned to obtain a halftone phase shift mask 20.
申请公布号 JPH11258772(A) 申请公布日期 1999.09.24
申请号 JP19980065775 申请日期 1998.03.16
申请人 TOPPAN PRINTING CO LTD 发明人 HARAGUCHI TAKASHI;MATSUO TADASHI
分类号 H01L21/027;G03F1/32;G03F1/68 主分类号 H01L21/027
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