发明名称 |
X-RAY FLUORESCENT EMISSION ANALYSIS TO DETERMINE MATERIAL CONCENTRATION |
摘要 |
A method and apparatus is disclosed to determine a concentration of dopant in soot that constitutes at least a portion of a soot preform (12) used to form an optical wave guide. The photon source (30) irradiates the soot preform on a mandrel (14). X-ray fluorescent emissions, from the irradiated soot are detected, and the concentration of dopant is determined based on the detected X-ray fluorescent emissions. Additionally, the concentration of dopant in layers of soot on the preform can be controlled by utilizing the detected X-ray fluorescent emissions to determine a deviation between a concentration of dopant in the soot and a predetermined concentration, and adjusting deposition conditions based on the deviation. |
申请公布号 |
WO0037929(A1) |
申请公布日期 |
2000.06.29 |
申请号 |
WO1999US28951 |
申请日期 |
1999.12.06 |
申请人 |
CORNING INCORPORATED;QUINN, ALAN, P. |
发明人 |
QUINN, ALAN, P. |
分类号 |
C03B37/018;G01N23/223;(IPC1-7):G01N23/223 |
主分类号 |
C03B37/018 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|