发明名称 TEST DEVICE AND TEST METHOD FOR DECODER
摘要 PROBLEM TO BE SOLVED: To provide a test device capable of easily inspecting a decoder of a recording medium in need of a lot of data. SOLUTION: On an evaluation board 20 for inspection, the data producing function 21 is furnished for producing test data by replacing a part of reproduced data supplied from an MO drive 33 with error data. Further, since an optical disk control(ODC) chip 10 being an object for inspection is provided with the format information of the reproduced data, the evaluation board 20 capable of automatically producing the test data is supplied at a low cost with the a simple constitution by obtaining the timing for substituting for the error data from the ODC chip 10.
申请公布号 JP2000285614(A) 申请公布日期 2000.10.13
申请号 JP19990094084 申请日期 1999.03.31
申请人 SEIKO EPSON CORP 发明人 SATO DAISUKE;HIYOSHI YASUTOKU
分类号 G11B20/18;(IPC1-7):G11B20/18 主分类号 G11B20/18
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