发明名称 PROBE UNIT FOR FOUR-TERMINAL MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To provide a probe unit for four-terminal measurement suitable for measuring the resistance of a measured object made of a large conductor by a four-terminal measuring method. SOLUTION: A Hi-side current feeding terminal section 12, a Hi-side voltage detecting terminal section 22, a Lo-side current feeding terminal section 32, and a Lo-side voltage detecting terminal section 42 are combined to form this probe unit for four-terminal measurement. The current feeding terminal section 12 and the voltage detecting terminal section 22 are arranged separately from each other at a fixed interval on one side base section 21 made of an insulating material and are integrated into a Hi-side terminal body 11. The voltage detecting terminal section 42 and the current feeding terminal section 32 are arranged separately from each other at a fixed interval on the other side base section 41 and are integrated into a Lo-side terminal body 31. The Hi-side terminal body 11 and the Lo-side terminal body 31 allow the Hi-side voltage detecting terminal section 22 and the Lo-side voltage detecting terminal section 42 to be freely installed face to face with respect to the measured object 51.
申请公布号 JP2001311751(A) 申请公布日期 2001.11.09
申请号 JP20000131159 申请日期 2000.04.28
申请人 HIOKI EE CORP 发明人 TOMIYAMA HIDEKI;KOBAYASHI KENJI
分类号 G01R1/073;G01R27/02;(IPC1-7):G01R27/02 主分类号 G01R1/073
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