发明名称 Stacked gate MOS structure for multiple voltage power supply applications
摘要 A capacitor structure is formed on a semiconductor substrate to provide split voltages for semiconductor circuits. An active area is formed in the substrate serving as a lower capacitor plate for a bottom capacitor. A thin dielectric layer and field oxide regions are formed on the substrate, and the dielectric layer is covered with a capacitor plate over the active area to complete the bottom capacitor. A thick dielectric layer is formed over the device and a via is formed through the thick dielectric layer to the upper capacitor plate. A second lower plate is formed for a top capacitor. An inter-layer dielectric layer is formed over the second lower plate. An upper capacitor layer is formed over the inter-layer dielectric layer to form a top capacitor with a different capacitance value from the bottom capacitor. The value of the capacitance can be varied by selection of the permittivity and/or thickness of the dielectric layer and by variation of the effective plate area of the top and bottom capacitors.
申请公布号 US6476460(B1) 申请公布日期 2002.11.05
申请号 US20000514845 申请日期 2000.02.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTING COMPANY 发明人 LIANG MONG-SONG;LEE JIN-YUAN;YOO CHOE-SAN
分类号 H01L21/02;(IPC1-7):H01L29/00 主分类号 H01L21/02
代理机构 代理人
主权项
地址