发明名称 NAND non-volatile two-bit memory and fabrication method
摘要 A NAND non-volatile two-bit memory cell comprises a cell stack and two select stacks disposed on an active area of a substrate. Each select stack is respectively disposed on a side of the cell stack with a sidewall between the cell stack and a respective select stack. The cell stack has four components: a first dielectric layer disposed over the substrate; a charge accumulation layer capable of holding charge in a portion thereof to store information and disposed over the first dielectric layer; a second dielectric layer disposed over the charge accumulation layer; and a control gate disposed over the second dielectric layer. The select stack has two components: a third dielectric layer disposed over the substrate and a select gate, capable of inverting an underneath channel region to function as a source or a drain of the memory cell, disposed over the third dielectric layer.
申请公布号 US7547941(B2) 申请公布日期 2009.06.16
申请号 US20060417602 申请日期 2006.05.04
申请人 ELITE SEMICONDUCTOR MEMORY TECHNOLOGY, INC. 发明人 CHEN CHUNG-ZEN
分类号 H01L29/778;H01L29/76 主分类号 H01L29/778
代理机构 代理人
主权项
地址