Illumination device and reflection characteristic measuring device

摘要

An illumination device is provided with a light source, a photodetector, and a support structure. The light source, which emits light, has light distribution in which a reference axis serves as an axis of symmetry or light distribution in which a plane including the reference axis serves as a plane of symmetry. A first light beam in the light is guided to the object to be illuminated. A second light beam in the light is guided to the photodetector. The photodetector detects intensity of the second light beam. The light source and the photodetector are supported by the support structure in positions and postures that allow the first light beam and the second light beam to be guided in an aforementioned manner. A traveling direction of the first light beam and a traveling direction of the second light beam make the same angle with the reference axis.

主权项

1. An illumination device comprising:
a light source configured to emit light, having a reference axis, and having light distribution in which the reference axis serves as an axis of symmetry or light distribution in which a plane including the reference axis serves as a plane of symmetry, the light including a first light beam and a second light beam, a traveling direction of the first light beam making a first angle with the reference axis, a traveling direction of the second light beam making a second angle with the reference axis, and the second angle being the same as the first angle; a photodetector configured to detect intensity of the second light beam; and a support structure configured to support the light source and the photodetector in positions and postures that allow the first light beam to be guided to an object to be illuminated, and the second light beam to be guided to the photodetector.