发明名称 Electronic devices having semiconductor memory units and method of fabricating the same
摘要 Electronic devices have a semiconductor memory unit including a magnetization compensation layer in a contact plug. One implementation of the semiconductor memory unit includes a variable resistance element having a stacked structure of a first magnetic layer, a tunnel barrier layer, and a second magnetic layer, and a contact plug arranged in at least one side of the variable resistance element and comprising a magnetization compensation layer. Another implementation includes a variable resistance element having a stacked structure of a first magnetic layer having a variable magnetization, a tunnel barrier layer, and a second magnetic layer having a pinned magnetization; and a contact plug arranged at one side of and separated from the variable resistance element to include a magnetization compensation layer that produces a magnetic field to reduce an influence of a magnetic field of the second magnetic layer on the first magnetic layer.
申请公布号 US9411734(B2) 申请公布日期 2016.08.09
申请号 US201314142911 申请日期 2013.12.29
申请人 SK hynix Inc. 发明人 Dong Cha-Deok
分类号 H01L43/02;H01L27/22;G06F12/08;H01L43/08 主分类号 H01L43/02
代理机构 Perkins Coie LLP 代理人 Perkins Coie LLP
主权项 1. An electronic device comprising a semiconductor memory unit that includes: a variable resistance element having a stacked structure of a first magnetic layer having a variable magnetization, a tunnel barrier layer, and a second magnetic layer having a pinned magnetization; and a contact plug arranged at one side of the variable resistance element and separated from the variable resistance element, the contact plug comprising a magnetization compensation layer that produces a magnetic field at the variable resistance element to reduce an influence of a magnetic field of the second magnetic layer on the first magnetic layer.
地址 Icheon-Si KR