发明名称 SHEET INSPECTION AND MARKING SYSTEM
摘要 <p>Method and apparatus for inspecting and marking flawed sheet material. Sheet material (10) is moved from a supply (11) along its length through a path to a cutter (22). The sheet material is visually inspected as it moves along its path, and a temporary electrically conductive mark (21) is applied to the moving material at a predetermined distance away from any flaw (19) that appears in the sheet material. The temporary mark (21) is electrically detected by a detector (29) at a position along the path the same predetermined distance away from the cutter (22) as the flaw moves into the cutter (22), and as the last portion of the segment (28) to be cut from the sheet material moves to the cutter (22), the sheet material is marked with a permanent mark (30). The sheet material is then cut and folded, and the permanent mark (30) is located at a predetermined position in the folded segment of sheet material, no matter at which location in the segment (28) of the sheet material the flow (19) appears. </p>
申请公布号 WO1980000931(A1) 申请公布日期 1980.05.15
申请号 US1979000902 申请日期 1979.10.24
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