首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
ESSBARES FETTPRODUKT UND VERFAHREN ZUR HERSTELLUNG EINES SOLCHEN PRODUKTES.
摘要
申请公布号
DE3762382(D1)
申请公布日期
1990.05.31
申请号
DE19873762382
申请日期
1987.09.23
申请人
UNILEVER N.V., ROTTERDAM, NL
发明人
WESDORP, LEENDERT HENDRIK, NL-3123 PN SCHIEDAM, NL;STRUIK, MATTHEUS, NL-3137 HN VLAARDINGEN, NL
分类号
A23D7/00;A23D7/015;A23D7/02;(IPC1-7):A23D7/00
主分类号
A23D7/00
代理机构
代理人
主权项
地址
您可能感兴趣的专利
SYSTEMS AND METHODS FOR NEAR FIELD TARGET SIMULATION
MAGNETIC RESONANCE SYSTEM AND OPERATING METHOD THEREFOR
METHOD AND APPARATUS FOR REDUCTION OF GRADIENT COIL VIBRATION IN MRI SYSTEMS
MAGNETIC SUBSTANCE DETECTION DEVICE
METHOD AND APPARATUS FOR LEARNING AND ESTIMATING BATTERY STATE INFORMATION
STATE-OF-CHARGE ESTIMATION DEVICE AND STATE-OF-CHARGE ESTIMATION METHOD
Method for Operation of a Self-Powered Power Sensor (SPPS) Having a Reservoir Capacitor
INTEGRATED CIRCUIT WITH INTEGRATED CURRENT SENSOR
PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
METHODS AND SYSTEMS FOR ALIGNING A MOBILE DEVICE TO A VEHICLE
ARTICLES AND METHODS FOR RAPID THC DETECTION
CLEANABILITY ASSESSMENT OF SUBLIMATE FROM LITHOGRAPHY MATERIALS
Sensor Device, Filter Assembly, and Method for Manufacturing Same
ELECTROCHEMICAL GAS SENSOR SYSTEM
END-FILL ELECTROCHEMICAL-BASED ANALYTICAL TEST STRIP WITH PERPENDICULAR INTERSECTING SAMPLE-RECEIVING CHAMBERS
SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INSPECTION METHOD
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
DETERMINING PERCENT SOLIDS IN SUSPENSION USING RAMAN SPECTROSCOPY
OPTICAL MODULE
TIME DIVISION MULTIPLEXING (TDM) AND WAVELENGTH DIVISION MULTIPLEXING (WDM) SENSOR ARRAYS
