AUTOMATIC GENERATOR FOR LSI TESTER TESTING PROGRAM

摘要

PURPOSE:To shorten test program preparing time by automatically extracting and storing a test condition, preparing a test condition table capable of showing test items and conditions necessary for respective test items as a table by a test condition table displaying means and automatically generating a test program. CONSTITUTION:A standard test item group necessary for an LSI device is previously displayed on a test item selecting screen 1 and items can be deleted or newly added in accordance with a device. A user selects necessary test items from the screen 1 and a series of test instructions 5 for the device are completed through a control part. Consequently a test condition table corresponding to each test is automatically displayed on a screen 2. The sorts of test conditions necessary for all test items and reference values to be used for the execution of respective test conditions are displayed on the test condition table displaying screen as a list.