Method and apparatus for measuring surface reflectance of light-transmitting type antireflection optical function film and method of producing the film

摘要

A method and apparatus for measuring a surface reflectance of an antireflection optical function film for use on a CRT display panel etc. accurately and in real time by the following formula: RIs=RI-(TI)2x[RIb/(1-RIb)2]where, RIs is the surface reflectance of the light-transmitting type antireflection optical function film, RI is the actually measurable total reflectance, TI is the actually measurable transmittance, and RIb is the back reflectance calculated by a regression formula.