发明名称 Thin film transistor with metal oxide layer and method of making same
摘要 A thin film transistor includes an insulating substrate, an active layer located over the substrate, a gate electrode located over the substrate; and a charge storage region located between the active layer and the gate electrode. The charge storage region includes a tunneling dielectric located adjacent to the active layer, a blocking dielectric located adjacent to the gate electrode and a charge storage dielectric located between the tunneling dielectric and the blocking dielectric. At least one of the tunneling dielectric, the charge storage dielectric and the blocking dielectric comprises a layer having a dielectric constant greater than 3.9, such as a metal oxide layer.
申请公布号 US6858899(B2) 申请公布日期 2005.02.22
申请号 US20020270127 申请日期 2002.10.15
申请人 MATRIX SEMICONDUCTOR, INC. 发明人 MAHAJANI MAITREYEE;WALKER ANDREW J.
分类号 H01L21/84;H01L27/06;H01L27/115;H01L27/12;H01L29/51;H01L29/792;(IPC1-7):H01L27/01 主分类号 H01L21/84
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