发明名称 Method for wafer bonding (A1, In, Ga)N and Zn(S, Se) for optoelectronic applications
摘要 A method for producing a wafer bonded structure between (Al, In, Ga)N and Zn(S,Se). A highly reflective and conductive distributed Bragg reflector (DBR) for relatively short optical wave lengths can be fabricated using Zn(S,Se) and MgS/(Zn, Cd)Se materials. Using wafer bonding techniques, these high-quality DBR structures can be combined with a GaN-based optical device structure.
申请公布号 US7344958(B2) 申请公布日期 2008.03.18
申请号 US20050175761 申请日期 2005.07.06
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA;UNIVERSITAET BREMEN;JAPAN SCIENCE AND TECHNOLOGY AGENCY 发明人 MURAI AKIHIKO;MCCARTHY LEE;MISHRA UMESH K.;DENBAARS STEVEN P.;KRUSE CARSTEN;FIGGE STEPHAN;HOMMEL DETLEF
分类号 H01L21/30;H01L21/46;H01L33/00 主分类号 H01L21/30
代理机构 代理人
主权项
地址