METHOD AND APPARATUS FOR INSPECTING IC PART CONNECTING PART

摘要

PROBLEM TO BE SOLVED: To provide an IC part inspection apparatus capable of verifying operations in a loaded state without breaking IC chips or electrodes.

SOLUTION: The IC part inspection apparatus communicates with reader/writer 32 via an antenna part 31 while an ultrasonic oscillator 41 loads vibrations on a strap substrate 22 to which an IC chip 23 is connected via electrodes 24a and 24b. The state of connection between the IC chip 23 and the strap substrate 22 is judged on the basis of the propriety of the communication.

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