发明名称 METHOD OF MANUFACTURING SILICON NITRIDE FILM
摘要 <p>In the formation of a silicon nitride film, dichlorosilane and ammonia are used as source gas and, for example, argon is used as carrier gas. The pressure (total pressure) inside a chamber is set to about 100 to 300 Torr (1.33x104 to 4.00x104 Pa). The desirable setting is that, for example, dichlorosilane is 60 SCCM, ammonia is 300 SCCM and hydrogen is 20 SLM. When the silicon nitride film is formed under such conditions, improvement in a masking effect of the silicon nitride film for preventing oxidation can be achieved.</p>
申请公布号 KR0162165(B1) 申请公布日期 1999.02.01
申请号 KR19950005718 申请日期 1995.03.18
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 INABA, YUTAKA;KOBAYASHI, KIYOTERU
分类号 C23C16/34;C23C16/42;H01L21/314;H01L21/318;H01L21/8242;H01L27/108;(IPC1-7):H01L21/31 主分类号 C23C16/34
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