发明名称 Verfahren zur Herstellung einer Al-Ge Legierung mit einer WGe Polierstoppschicht
摘要 A structure and method for fabricating circuits which use field effect transistors (FETs), bipolar transistors, or BiCMOS (combined Bipolar/Complementary Metal Oxide Silicon structures), uses low temperature germanium gas flow to affect metals and alloys deposited in high aspect ratio structures including lines and vias. By using a germanium gas flow, germanium (Ge) will be introduced in a surface reaction which prevents voids and side seams and which also provides a passivating layer of CuGe. If a hard cap is needed for surface passivation or a wear-resistance application, the GeH4 gas followed by WF6 can be used to produce an in-situ hard cap of WxGey. Further, high aspect ratio vias/lines (aspect ratio of 3 or more) can be filled by utilizing low pressures and high temperatures (i.e., below 450 DEG C) without degrading the underlying metals. <MATH> <MATH>
申请公布号 DE69513459(D1) 申请公布日期 1999.12.30
申请号 DE1995613459 申请日期 1995.07.05
申请人 INTERNATIONAL BUSINESS MACHINES CORP., ARMONK 发明人 JOSHI, RAJIV VASANT;TEJWANI, MANU JAMNADAS;SRIKRISHNAN, KRIS VENKATRAMAN
分类号 H01L21/28;H01L21/203;H01L21/205;H01L21/3205;H01L21/321;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L23/532 主分类号 H01L21/28
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