发明名称 |
CIRCUIT AND METHOD FOR OUTPUTTING TEMPERATURE DATA OF SEMICONDUCTOR MEMORY APPARATUS |
摘要 |
A circuit and a method for outputting temperature data of a semiconductor memory device are provided to remove an output error actually and completely. A temperature sensing circuit(500) generates a temperature voltage corresponding to temperature variation. An analog-digital conversion part(300) converts the temperature voltage into a first temperature code. A temperature data correction part(400) outputs a second temperature code by correcting the error of the first temperature code using a correction code. The temperature sensing circuit comprises a temperature sensor(110), a voltage adjustment part(120) and a fuse set(130). The temperature sensor outputs the temperature voltage inversely proportional to internal temperature of the semiconductor memory device and a first reference voltage with constant level regardless of temperature variation. The voltage adjustment part outputs a second reference voltage to define upper limit and lower limit of the temperature voltage. The fuse code adjusts plural resistance values according to cutting state of a plurality of fuses.
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申请公布号 |
KR20080033588(A) |
申请公布日期 |
2008.04.17 |
申请号 |
KR20060099180 |
申请日期 |
2006.10.12 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JEONG, CHUN SEOK;LEE, KANG SEOL |
分类号 |
G11C7/10;G11C5/14;G11C7/04;G11C11/406 |
主分类号 |
G11C7/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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