发明名称 |
VERTICAL NANOWIRE TRANSISTOR WITH AXIALLY ENGINEERED SEMICONDUCTOR AND GATE METALLIZATION |
摘要 |
Vertically oriented nanowire transistors including semiconductor layers or gate electrodes having compositions that vary over a length of the transistor. In embodiments, transistor channel regions are compositionally graded, or layered along a length of the channel to induce strain, and/or include a high mobility injection layer. In embodiments, a gate electrode stack including a plurality of gate electrode materials is deposited to modulate the gate electrode work function along the gate length. |
申请公布号 |
US2016163856(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201615040978 |
申请日期 |
2016.02.10 |
申请人 |
Intel Corporation |
发明人 |
Doyle Brian S.;Kotlyar Roza;Shah Uday;Kuo Charles C. |
分类号 |
H01L29/78;H01L21/02;H01L29/165;H01L29/06;H01L29/66;H01L29/423 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A vertical nanowire transistor, comprising:
a source region vertically aligned with a drain region along a longitudinal axis perpendicularly oriented to a surface plane of a crystalline substrate, the source region comprising a first semiconductor material and the drain region comprising a second semiconductor material different from the first semiconductor material; a channel region disposed between the source and drain region along the longitudinal axis, the channel region comprising a third semiconductor material different from the first and second semiconductor materials; and an annular gate electrode surrounding a sidewall of the channel region, separated by an annular gate dielectric layer. |
地址 |
Santa Clara CA US |