发明名称 VERTICAL NANOWIRE TRANSISTOR WITH AXIALLY ENGINEERED SEMICONDUCTOR AND GATE METALLIZATION
摘要 Vertically oriented nanowire transistors including semiconductor layers or gate electrodes having compositions that vary over a length of the transistor. In embodiments, transistor channel regions are compositionally graded, or layered along a length of the channel to induce strain, and/or include a high mobility injection layer. In embodiments, a gate electrode stack including a plurality of gate electrode materials is deposited to modulate the gate electrode work function along the gate length.
申请公布号 US2016163856(A1) 申请公布日期 2016.06.09
申请号 US201615040978 申请日期 2016.02.10
申请人 Intel Corporation 发明人 Doyle Brian S.;Kotlyar Roza;Shah Uday;Kuo Charles C.
分类号 H01L29/78;H01L21/02;H01L29/165;H01L29/06;H01L29/66;H01L29/423 主分类号 H01L29/78
代理机构 代理人
主权项 1. A vertical nanowire transistor, comprising: a source region vertically aligned with a drain region along a longitudinal axis perpendicularly oriented to a surface plane of a crystalline substrate, the source region comprising a first semiconductor material and the drain region comprising a second semiconductor material different from the first semiconductor material; a channel region disposed between the source and drain region along the longitudinal axis, the channel region comprising a third semiconductor material different from the first and second semiconductor materials; and an annular gate electrode surrounding a sidewall of the channel region, separated by an annular gate dielectric layer.
地址 Santa Clara CA US