发明名称 |
Semiconductor Devices with Transistor Cells and Thermoresistive Element |
摘要 |
A semiconductor device includes a first load terminal electrically coupled to a source zone of a transistor cell. A gate terminal is electrically coupled to a gate electrode which is capacitively coupled to a body zone of the transistor cell. The source and body zones are formed in a semiconductor portion. A thermoresistive element is thermally connected to the semiconductor portion and is electrically coupled between the gate terminal and the first load terminal. Above a maximum operation temperature specified for the semiconductor device, an electric resistance of the thermoresistive element decreases by at least two orders of magnitude within a critical temperature span of at most 50 Kelvin. |
申请公布号 |
US2016163689(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201514959276 |
申请日期 |
2015.12.04 |
申请人 |
Infineon Technologies AG |
发明人 |
Laven Johannes Georg;Jaeger Christian;Mahler Joachim;Pedone Daniel;Prueckl Anton;Schulze Hans-Joachim;Schwagmann Andre;Schwarz Patrick |
分类号 |
H01L27/02;H01L29/78 |
主分类号 |
H01L27/02 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a first load terminal electrically coupled to a source zone of a transistor cell; a gate terminal electrically coupled to a gate electrode which is capacitively coupled to a body zone of the transistor cell, the source and body zones being formed in a semiconductor portion; and a thermoresistive element thermally connected to the semiconductor portion and electrically coupled between the gate terminal and the first load terminal, wherein above a maximum operation temperature specified for the semiconductor device, an electric resistance of the thermoresistive element decreases by at least two orders of magnitude within a critical temperature span of at most 50 Kelvin. |
地址 |
Neubiberg DE |