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经营范围
发明名称
PROBE PIN STRUCTURE OF TESTING JIG FOR IN-CIRCUIT TESTER
摘要
申请公布号
JPH02150773(A)
申请公布日期
1990.06.11
申请号
JP19880302255
申请日期
1988.12.01
申请人
FUJITSU LTD
发明人
MATSUBAYASHI AKINORI;KOBAYASHI MASAAKI
分类号
G01R1/067;H05K13/08
主分类号
G01R1/067
代理机构
代理人
主权项
地址
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