发明名称 Semiconductor device with upper and lower gate electrode structure
摘要 A semiconductor device includes a layer on a substrate in which a two-dimensional electron gas is produced, source and drain electrodes disposed opposite each other on the substrate, and a gate electrode including a plurality of lower gate electrodes and an upper gate electrode. The lower gate electrodes are spaced at prescribed intervals in a direction perpendicular to a direction connecting the source and drain electrodes and connected to the layer only at their bottom surfaces. The upper gate electrode is disposed on the lower gate electrodes and electrically connects the lower gate electrodes to each other. When a bias voltage is applied to the gate electrode, a depletion layer spreads below the lower gate electrodes and the two-dimensional electron gas is concentrated beneath regions where the lower gate electrodes are absent, producing a quasi one-dimensional electron gas. Therefore, a semiconductor device utilizing the quasi one-dimensional electron gas as a channel current, in which parasitic capacitance is not increased, is achieved.
申请公布号 US5270556(A) 申请公布日期 1993.12.14
申请号 US19920921572 申请日期 1992.07.30
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SHIMURA, TERUYUKI
分类号 H01L29/201;H01L21/338;H01L29/06;H01L29/66;H01L29/775;H01L29/778;H01L29/80;H01L29/812;(IPC1-7):H01L31/072;H01L31/109;H01L31/075 主分类号 H01L29/201
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