发明名称 INTEGRATED CIRCUIT WITH LAYERED SUPERLATTICE MATERIAL AND METHOD OF FABRICATING SAME
摘要 A method of fabricating a layered superlattice DRAM (100) compatible with conventional silicon CMOS technology. A MOSFET (72) is formed on a silicon substrate (71). A thick layer (77D) of BPSG followed by a thin SOG layer (77E) overlies the MOSFET (72). A capacitor (80) is formed by depositing a layer (81) of platinum, annealing, depositing an intermediate layer (84) comprising a layered superlattice material, annealing, depositing a second layer (84) of platinum, then patterning the capacitor (80). Another SOG layer (86) is deposited, contact holes (106, 107) to the MOSFET (72) and capacitor (80) are partially opened, the SOG (86) is annealed, the contact holes (106, 107) are completely opened, and a Pt/Ti/PtSi wiring layer (88, 288) is deposited.
申请公布号 WO9410704(A1) 申请公布日期 1994.05.11
申请号 WO1993US10127 申请日期 1993.10.21
申请人 SYMETRIX CORPORATION;OLYMPUS OPTICAL CO., LTD. 发明人 YOSHIMORI, HIROYUKI;WATANABE, HITOSHI;PAZ DE ARUAJO, CARLOS, A.;HIRAIDE, SHUZO;MCMILLAN, LARRY, D.;MIHARA, TAKASHI
分类号 C01B13/32;C23C18/12;C30B7/00;C30B29/30;C30B29/32;H01L21/02;H01L21/314;H01L21/316;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;H01L27/115;H01L29/40 主分类号 C01B13/32
代理机构 代理人
主权项
地址