发明名称 Semiconductor processing methods of forming a plurality of capacitors on a substrate, bit line contacts and method of forming bit line contacts
摘要 Semiconductor processing methods include forming a plurality of patterned device outlines over a semiconductor substrate, forming electrically insulative partitions or spacers on at least a portion of the patterned device outlines, and forming a plurality of substantially identically shaped devices relative to the patterned device outlines. Individual formed devices are spaced from at least one other of the devices by a distance no more than a width of one of the electrically insulative spacers. In such manner, device pitch is reduced by almost fifty percent. According to one aspect, capacitors are formed which, according to a one embodiment, form part of a dynamic random access memory (DRAM) array.
申请公布号 US6395613(B1) 申请公布日期 2002.05.28
申请号 US20000651816 申请日期 2000.08.30
申请人 MICRON TECHNOLOGY, INC. 发明人 JUENGLING WERNER
分类号 H01L21/02;H01L21/768;H01L21/8242;H01L27/02;H01L27/108;H01L31/109;(IPC1-7):H01L21/20 主分类号 H01L21/02
代理机构 代理人
主权项
地址