发明名称 System and method for testing a memory for a memory failure exhibited by a failing memory
摘要 A system and method for testing a memory under test on automated test equipment (ATE) that includes capturing operating conditions for a memory exhibiting a memory failure in a sequence of records corresponding the operating conditions over a period of time that includes the occurrence of the memory failure and further includes executing a software translation module to generate a file of test vectors from the sequence of records that when executed by the ATE reproduce the operating condition over the sampled period of time. The memory under test is tested according to the file of test vectors for the ATE.
申请公布号 US7484142(B2) 申请公布日期 2009.01.27
申请号 US20060433220 申请日期 2006.05.11
申请人 MICRON TECHNOLOGY, INC. 发明人 CRUMP VALERIE;VAN ROOSENDAAL BRAD
分类号 G11C29/00;G11C7/00 主分类号 G11C29/00
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