| 摘要 |
PROBLEM TO BE SOLVED: To allow a simple configuration to adjust measuring force of a contact type probe.SOLUTION: A contact type probe 100 includes: a stylus 4; a spring 2; a magnetic body 6; and a permanent magnet 7. The stylus 4 is configured to be displaceable in an X-direction with a tip end in contact with a work piece, and the spring 2 has one end fixed, and other end gives the stylus 4 spring force along the X-direction. The magnetic body 6 has a position fixed with respect to the stylus 4, and the permanent magnet 7 is arranged with the permanent magnet spaced apart from the magnetic body 6 so that magnetic force acts along the X-direction between the magnetic body 6 and the permanent magnet.SELECTED DRAWING: Figure 1 |
