发明名称 Methods and apparatus for calibrating for transconductance or gain over process or condition variations in differential circuits
摘要 An apparatus is provided. The apparatus includes a calibration circuit configured to generate a reference signal and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal. The calibration circuit may be configured to generate the reference signal independent of the at least one differential circuit. A method for operating at least one differential circuit is provided. The method includes generating a reference signal and operating the at least one differential circuit at a calibrated transconductance or gain over process or condition variations based on the reference signal. The reference signal may be generated independently of the at least one differential circuit.
申请公布号 US9450540(B2) 申请公布日期 2016.09.20
申请号 US201514595106 申请日期 2015.01.12
申请人 QUALCOMM Incorporated 发明人 Li Miao;Sun Li;Zhu Zhi
分类号 H03F3/45;H03F1/30;H03G3/30;H03K19/003;H03K19/0185 主分类号 H03F3/45
代理机构 Arent Fox LLP 代理人 Arent Fox LLP
主权项 1. An apparatus, comprising: a calibration circuit configured to generate a reference signal; and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal, wherein the calibration circuit is further configured to generate the reference signal independent of the at least one differential circuit and to provide a feedback of the reference signal and adjust the reference signal based on the feedback, wherein the calibration circuit further comprises an operational transconductance amplifier (OTA) configured to generate a tail current based on the feedback.
地址 San Diego CA US