发明名称 XXRAY DIFFRACTION METER
摘要 An x-ray diffractometer is disclosed having a position-sensitive detector which is quasi-continuously movable in stepped fashion around a sample by a stepping motor. Output signals triggered by x-ray quanta are output from the position-sensitive detector and converted by an electronic evaluation unit into a time duration corresponding to a position of a particular x-ray quantum in the detector. The time-digital converter connected to the evaluation unit converts the time duration to a digital signal. A digital adder is provided having three inputs. The first input connects to an output of the time-digital converter, the second input connects to receive a digital value generated by a counter associated with the stepping motor, and a third input connects with a digital region selector. An output of the adder connects to a multi-channel analyzer having a plurality of regions therein for analyzing various desired measurement applications. The digital region selector addresses the appropriate region in the analyzer for a desired measurement application.
申请公布号 JPS55117948(A) 申请公布日期 1980.09.10
申请号 JP19800024635 申请日期 1980.02.28
申请人 SIEMENS AG 发明人 HERUBERUTO GEEBERU
分类号 G01N23/20;G01N23/207 主分类号 G01N23/20
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