发明名称 TESTING PROBE
摘要 PURPOSE:To obtain a relatively low cost testing probe by forming the probe by a plurality of contact pads on a flexible membrane and a plurality of lead wires formed on the membrane and connected to the contact pads. CONSTITUTION:A flexible membrane 1 is fixed to a printed circuit board 3 by a clamp 7. The clamp 7 serves also as a guide for a high polymer spring 9 for pressing the membrane 1. A surface mounting device 5 is used, for example, for the impedance matching between a DUT and lead wires 15 and mounted to the board 3. The leads 15 on the membrane 1 conduct the input and output of signals to and from the DUT, respectively, via contact pads 17. Thus, a relatively low cost testing probe can be obtained.
申请公布号 JPS62182672(A) 申请公布日期 1987.08.11
申请号 JP19870001561 申请日期 1987.01.07
申请人 YOKOGAWA HEWLETT PACKARD LTD 发明人 GARETSUTO EE GARETSUTOSON;KURINTON SHII CHIYAO;AAMANDO PII NIYUUKAMANZU;BURAIAN SHII RESURII;JIYATSUKU DEE FUOSUTAA;MAIKERU GURIINSUTAIN;FUARITSUDO MATSUTA;ROBAATO JIYORII
分类号 G01R31/26;G01R1/073;H01L21/66 主分类号 G01R31/26
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