发明名称 Method for forming insulating thin films
摘要 <p>To provide a method for forming insulating thin films that can induce condensation of silanol and dehydration to a high degree at or near ambient pressure. An interlevel dielectric layer is formed on a semiconductor substrate by coating hydrogen silsesquioxane resin onto the substrate and curing the hydrogen silsesquioxane resin to produce an interlevel dielectric layer. This interlevel dielectric layer is then heated at a pressure from 1 to 1,000 torr at a temperature from 150 to 550 DEG C</p>
申请公布号 EP0899780(A2) 申请公布日期 1999.03.03
申请号 EP19980116304 申请日期 1998.08.28
申请人 DOW CORNING TORAY SILICONE COMPANY, LTD. 发明人 KOBAYASHI, AKIHIKO;MINE, KATSUTOSHI;NAKAMURA, TAKASHI;SASAKI, MOTOSHI;SAWA, KIYOTAKA
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
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