发明名称 Chemical-mechanical polishing of semiconductor wafers
摘要 A chemical mechanical polishing process in a wafer is polished with slurry under selected operating conditions for a first time period that avoids overpolishing; and then polished with DI water under the selected operating conditions for a second time period until the surface of the wafer is substantially planar and dishing is minimized. The process can be used in conjunction with a damascene or dual-damascene process in which tungsten is polished with respect to BPSG.
申请公布号 US6008119(A) 申请公布日期 1999.12.28
申请号 US19970940762 申请日期 1997.09.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FOURNIER, BERNARD
分类号 H01L21/321;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/321
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