发明名称 Structure and process for reducing die corner and edge stresses in microelectronic packages
摘要 A microelectronic die is aligned with a package substrate and attached to it using solder balls. A specially shaped heat spreader, preferably with a coefficient of thermal expansion (CTE) similar to that of silicon, is attached to the back side of the die using a heat-conducting adhesive. An epoxy-based material is flowed into the gap between the die, the substrate, and the heat spreader via a through-hole in either the substrate or the heat spreader using a dispense process or a transfer molding process. By positioning the heat spreader to abut the die corners and/or edges, the stresses on the die are substantially reduced or eliminated.
申请公布号 AU9633201(A) 申请公布日期 2002.04.08
申请号 AU20010096332 申请日期 2001.09.25
申请人 INTEL CORPORATION 发明人 QING MA;JAMES MAVEETY;QUAN TRAN
分类号 H01L23/36;H01L23/367 主分类号 H01L23/36
代理机构 代理人
主权项
地址