发明名称 |
MEASURING METHOD OF TARGET MATERIAL |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a measuring method capable of detecting a complex of an antigen or an antibody directly by using a field effect transistor (FET) without using a secondary antibody or the like, concerning a sandwich type immunoassay method. <P>SOLUTION: This measuring method of a target material includes processes for: (a) forming a complex comprising a polypeptide including a VH domain of an antibody for recognizing specifically the target material, a polypeptide including a VL domain of the antibody for recognizing specifically the target material, and the target material; and (b) measuring the complex formed in the process (a) by a field effect transistor sensor. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009133800(A) |
申请公布日期 |
2009.06.18 |
申请号 |
JP20070312057 |
申请日期 |
2007.12.03 |
申请人 |
FUJIFILM CORP;UNIV OF TOKYO |
发明人 |
KAWAKAMI MASAYUKI;SAKATA TOSHIYA;MIYAHARA YUJI;MATSUMOTO RYO;UEDA HIROSHI;IHARA MASAKI |
分类号 |
G01N27/414;G01N27/416;G01N33/53;G01N33/543 |
主分类号 |
G01N27/414 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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