发明名称 MEASURING METHOD OF TARGET MATERIAL
摘要 <P>PROBLEM TO BE SOLVED: To provide a measuring method capable of detecting a complex of an antigen or an antibody directly by using a field effect transistor (FET) without using a secondary antibody or the like, concerning a sandwich type immunoassay method. <P>SOLUTION: This measuring method of a target material includes processes for: (a) forming a complex comprising a polypeptide including a VH domain of an antibody for recognizing specifically the target material, a polypeptide including a VL domain of the antibody for recognizing specifically the target material, and the target material; and (b) measuring the complex formed in the process (a) by a field effect transistor sensor. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009133800(A) 申请公布日期 2009.06.18
申请号 JP20070312057 申请日期 2007.12.03
申请人 FUJIFILM CORP;UNIV OF TOKYO 发明人 KAWAKAMI MASAYUKI;SAKATA TOSHIYA;MIYAHARA YUJI;MATSUMOTO RYO;UEDA HIROSHI;IHARA MASAKI
分类号 G01N27/414;G01N27/416;G01N33/53;G01N33/543 主分类号 G01N27/414
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