| 发明名称 |
ABNORMAL PATTERN ANALYSIS METHOD, ABNORMAL PATTERN ANALYSIS APPARATUS PERFORMING THE SAME AND STORAGE MEDIUM STORING THE SAME |
| 摘要 |
An abnormal pattern analysis method includes determining a service application associated with analysis data, selecting at least one abnormal pattern analysis module in an abnormal pattern analysis framework based on the determined service application and performing an analysis for the analysis data through the selected at least one abnormal pattern analysis module to detect an abnormal pattern. |
| 申请公布号 |
US2016162759(A1) |
申请公布日期 |
2016.06.09 |
| 申请号 |
US201414561759 |
申请日期 |
2014.12.05 |
| 申请人 |
LG CNS CO., LTD. |
发明人 |
YUN Hae Yong;Lee Kang Hee;Cho Ki Hyun;Yoo Seong Jin |
| 分类号 |
G06K9/64 |
主分类号 |
G06K9/64 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An abnormal pattern analysis method, the method comprising:
determining a service application associated with analysis data; selecting at least one abnormal pattern analysis module a plurality of different types of modules in an abnormal pattern analysis framework based on the determined service application; and performing an analysis for the analysis data through the selected at least one abnormal pattern analysis module to detect an abnormal pattern in the analysis data. |
| 地址 |
Seoul KR |
