发明名称 PART MOUNTING DEVICE AND OPTICAL AXIS OFFSET QUANTITY MEASURING METHOD FOR IMAGE PICKUP MEANS THEREIN
摘要 PROBLEM TO BE SOLVED: To highly accurately measure optical offset quantity by moving an image pickup means to a first position, storing a proofreading mark as a micro movement second position on the optical axis of a second image pickup part and storing the difference between both positions as optical axis offset quantity. SOLUTION: The parallel degree of the respective parts of a part mounting device is adjusted (STP1), a printed board is sucked/fixed to the upper face of X-Y stages (STP2), and a chip storage tray is fixed on the upper face of a Y stage. A control unit moves the chip storage tray in the Y direction and positions it. Then, it moves the tray to a chip storage side and positions it. A prescribed chip in the chip storage tray is sucked (STP4). A chip inversion X stage is moved to a printed board-side and is positioned (STP5). It is moved to a tray-side and is sheltered (STP6). The control unit recognizes the chip mounting position of the printed board with the operation of a camera (STP7), and the chip mounting position of the printed board is corrected for the correction of a chip position (STP8). Then, the chip can be mounted with high accuracy (STP10).
申请公布号 JP2000236198(A) 申请公布日期 2000.08.29
申请号 JP19990034730 申请日期 1999.02.12
申请人 SONY CORP 发明人 WATANABE AKIHIKO;HOSOI MASAHISA;TANAKA TAKEHITO
分类号 H05K13/04;H05K13/08 主分类号 H05K13/04
代理机构 代理人
主权项
地址