发明名称 PHOTORESIST MATERIAL AND PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To obtain a photoresist material excellent in the stability of sensitivity to long-term preservation and a variation of ambient temperature by incorporating an &alpha;,&beta;-unsaturated ketone compound. SOLUTION: The photoresist material contains at least an &alpha;,&beta;-unsaturated ketone compound. This ketone compound may be represented by the formula, wherein R1 and R2 are each 1-10C linear alkyl, 3-10C branched or cyclic alkyl or 6-14C aryl. The photoresist material is particularly profitable when used as a chemical amplification type one exposed with high energy lines, X-rays or electron beams having such a short wavelength as <=500 nm. The photoresist material is applied on a substrate, heat-treated, exposed with high energy lines, X-rays or electron beams having <=500 nm wavelength through a photomask and developed with a developer to form the objective pattern.
申请公布号 JP2000250204(A) 申请公布日期 2000.09.14
申请号 JP19990056944 申请日期 1999.03.04
申请人 SHIN ETSU CHEM CO LTD 发明人 KANEKO TATSUSHI;KOIZUMI KENJI;WATANABE SATOSHI;YANAGI YOSHIAKI
分类号 H01L21/027;G03F7/004;G03F7/038;G03F7/039 主分类号 H01L21/027
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