发明名称 METHOD OF FORMING FLOATING GATE OF FLASH MEMORY USING SIDEWALL METHOD TO REDUCE NUMBER OF PRODUCING PROCESSES AND PRODUCTION COST
摘要 PURPOSE: A method of forming a floating gate of a flash memory using a sidewall method is provided to reduce the number of producing processes and the production cost by forming a poly sidewall on a sidewall of a trench region of an insulating layer. CONSTITUTION: An insulating layer is deposited and etched on an STI substrate. A floating gate poly is deposited thereon. A poly sidewall is formed by etching the floating gate poly. The insulating layer is removed therefrom. CSD(Cell Source Drain) ions for a floating gate are implanted therein. A pattern is removed therefrom and an ONO is deposited thereon. A control gate poly and a select gate poly are deposited thereon. The control gate poly and the select gate poly are etched. The CSD ions for the select gate are implanted therein.
申请公布号 KR20050017121(A) 申请公布日期 2005.02.22
申请号 KR20030054837 申请日期 2003.08.08
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 KIM, JAE YOUNG
分类号 H01L21/336;H01L21/8247;H01L27/115;H01L29/76;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 主分类号 H01L21/336
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