发明名称 |
METHOD OF FORMING FLOATING GATE OF FLASH MEMORY USING SIDEWALL METHOD TO REDUCE NUMBER OF PRODUCING PROCESSES AND PRODUCTION COST |
摘要 |
PURPOSE: A method of forming a floating gate of a flash memory using a sidewall method is provided to reduce the number of producing processes and the production cost by forming a poly sidewall on a sidewall of a trench region of an insulating layer. CONSTITUTION: An insulating layer is deposited and etched on an STI substrate. A floating gate poly is deposited thereon. A poly sidewall is formed by etching the floating gate poly. The insulating layer is removed therefrom. CSD(Cell Source Drain) ions for a floating gate are implanted therein. A pattern is removed therefrom and an ONO is deposited thereon. A control gate poly and a select gate poly are deposited thereon. The control gate poly and the select gate poly are etched. The CSD ions for the select gate are implanted therein.
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申请公布号 |
KR20050017121(A) |
申请公布日期 |
2005.02.22 |
申请号 |
KR20030054837 |
申请日期 |
2003.08.08 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
KIM, JAE YOUNG |
分类号 |
H01L21/336;H01L21/8247;H01L27/115;H01L29/76;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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