发明名称 |
Pellicle for EUV, and an assembly including the pellicle, and a method for assembling the same |
摘要 |
Here are disclosed a pellicle for EUV and an assembly made up of this pellicle and a mask, which brings about a projection of low contrast (intensity) shadows of a mesh structure on the mask, thus minimizing the adverse effect of the shadow on the lithographic printing; also a method for assembling such assembly is disclosed wherein the pellicle is rotated relative to the mask to minimize the shadow contrast, in terms of a contrast ratio, of the mesh structure; the angle of the rotation is 30 degrees or smaller, and the resultant contrast ratio should be 25% or lower. |
申请公布号 |
US9405184(B2) |
申请公布日期 |
2016.08.02 |
申请号 |
US201514598616 |
申请日期 |
2015.01.16 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
Yamada Motoyuki;Akiyama Shoji |
分类号 |
G03F1/24;G03F1/62;G03F1/64;G03F1/00 |
主分类号 |
G03F1/24 |
代理机构 |
Westerman, Hattori, Daniels & Adrian, LLP |
代理人 |
Westerman, Hattori, Daniels & Adrian, LLP |
主权项 |
1. A pellicle for EUV which comprises: (i) a pellicle membrane structure having a pellicle membrane and a mesh structure, the latter reinforcing the former, and (ii) a pellicle frame for holding the pellicle membrane structure, the mesh structure being disposed to be projected in two kinds of image shadow on a wafer on account of EUV light's passing the EUV pellicle twice as it approaches and reflects on a pattern-carrying face of a mask; wherein a stand-off of the pellicle is of such a value as to allow the contrast ratio between the two kinds of image shadow of the mesh structure to be 25% or lower. |
地址 |
Tokyo JP |